Abstract
Phenomenological definitions of generation-recombination noise, survival time, and the photoelectric gain factor for photoresistors are given. The optimal – i.e., from the point of view of detectability – topology in the case where shaded portions of the sensitive element are applied is determined.
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Dolganin, Y.N., Savchenko, M.A. Optimization of the Topology of Photoresistors. Measurement Techniques 47, 47–52 (2004). https://doi.org/10.1023/B:METE.0000022503.64541.c5
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DOI: https://doi.org/10.1023/B:METE.0000022503.64541.c5