Skip to main content
SpringerLink
Log in

Transmission electron microscopy investigation of the interface formation between silicon and anodic alumina

  • Published:
Journal of Materials Science Aims and scope Submit manuscript

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

References

  1. F. Keller, M. S. Hunter and D. L. Robinson, J. Electrochem. Soc. 100 (1953) 411.

    Google Scholar 

  2. H. Masuda, F. Hasegawa and S. Ono, ibid. 144 (1997) L127.

    Google Scholar 

  3. Idem., Science 268 (1995) 1466.

    Google Scholar 

  4. G. Sauer, G. Behm, S. Schneider, K. Nielsch, R. B. Wehrspohn, J. Choi, H. Hofmeister and U. GÖsele, J. Appl. Phys. 91 (2002) 3243.

    Google Scholar 

  5. K. Nielsch, R. B. Wehrspohn, J. Barthel, J. Kirschner, U. GÖsele, S. F. Fischer and H. KronmÜller, Appl. Phys. Lett. 79 (2001) 1360.

    Google Scholar 

  6. Z. K. Wang, M. H. Kuok, S. C. Ng, D. J. Lockwood, M. G. Cootam, K. Nielsch, R. B. Wehrspohn and U. GÖsele, Phys. Rev. Lett. 89 (2002) 027201.

    Google Scholar 

  7. O. Jessensky, F. MÜller and U. GÖsele, Appl. Phys. Lett. 72 (1998) 1173.

    Google Scholar 

  8. M. Steinhart, J. H. Wendorff, A. Greiner, R. B. Wehrspohn, K. Nielsch, J. Schilling, J. Choi and U. GÖsele, Science 296 (2002) 1997.

    Google Scholar 

  9. S. J. Klepeis, J. P. Benedict and R. M. Anderson, in MRS Symposium Proceedings “Specimen Preparation for Transmission Electron Microscopy of Materials,” edited by J. C. Bravman. (1987) Vol. 155, p. 179.

Download references

Author information

Authors and Affiliations

  1. Institute of Physics, Solid Surfaces Analysis Group, Chemnitz University of Technology, 09107, Chemnitz, Germany

    F. Müller, A.-D. Müller, S. Schulze & M. Hietschold

Authors
  1. F. Müller
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. A.-D. Müller
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. S. Schulze
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. M. Hietschold
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Müller, F., Müller, AD., Schulze, S. et al. Transmission electron microscopy investigation of the interface formation between silicon and anodic alumina. Journal of Materials Science 39, 3199–3200 (2004). https://doi.org/10.1023/B:JMSC.0000025858.30792.bf

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1023/B:JMSC.0000025858.30792.bf

Keywords

Search

Navigation