Abstract
Reasons for the appearance of a background signal in the relatively soft x-ray range (2–15 keV) upon fluorescence excitation with the 241Am radioisotope are discussed. Mathematical models are proposed for the interaction of the radiation of the radioactive source with the sample and the Si(Li) detector, capable of describing the appearance of the analytical and background signals. It was shown that processes occurring in the Si(Li) detector should be taken into account to explain and calculate the background signal in this range. The results of calculations agree well with the experimental data obtained using an 241Am radiation source for fluorescence excitation.
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REFERENCES
Bakhtiarov, A.V., Rentgenospektral'nyi fluorestsentnyi analiz v geologii i geokhimii (X-ray Fluorescence Analysis in Geology and Geochemistry), Moscow: Nedra, 1985.
Fernandez, J.E., X-ray Spectrom., 1992, vol. 21, p. 57.
Fernandez, J.E., Hubbell, J.H., Hanson, A.L., and Spenser, L.V., Radiat. Phys. Chem., 1993, vol. 41, nos.4-5, p. 579.
Belykh, V.V., Smagunova, A.N., and Kozlov, V.A., Zh. Anal. Khim., 1994, vol. 49, no. 10, p. 1092.
Sukhorukov, B.L., Smagunova, A.N., Pavlinskii, G.V., and Losev, N.F., Zh. Anal. Khim., 1975, vol. 30, p. 372.
Pavlinskii, G.V., Ivshev, D.V., and Imeshkenova, N.N., Zh. Anal. Khim., 1991, vol. 46, p. 525.
Pavlinskii, G.V., Appar. Metody Rentgenovskogo Anal., 1992, no. 41, p. 83.
Keith, H.D. and Loomis, T.C., X-ray Spectrom., 1976, vol. 5, p. 93.
Akimov, Yu.K., Ignat'ev, O.V., Kalinin, A.I., and Kushniruk, V.F., Poluprovodnikovye detektory v eksperimental'noi fizike (Semiconductor Detectors in Experimental Physics), Moscow: Energoatomizdat, 1989.
Lowe, B.G., Nucl. Instrum. Methods Phys. Res., Sect. A, 2000, vol. 439, p. 247.
Thomson, J.J., The Conduction of Electricity through Gases, London: Cambridge University Press, 1906.
Hubbell, J.H., Veigele, Wm.J., Braggs, E.A., Brown, R.T., Cromer, D.T., and Howerton, R.J., J. Phys. Chem. Ref. Data, 1975, vol. 4, no. 3, p. 471.
Bakhtiarov, A.V. and Pshenichnyi, G.A., Appar. Metody Rentgenovskogo Anal., 1972, no. 11, p. 200.
Klein, O. and Nishina, Y., Z. Phys., 1929, vol. 52, p. 853.
Finkelshtein, A.L. and Pavlova, T.O., X-ray Spectrom., 1999, vol. 28, no. 1, p. 27.
Reed, S.J.R., X-ray Spectrom., 1975, vol. 4, no. 1, p. 14.
Statham, P.J., X-ray Spectrum., 1976, vol. 5, no. 3, p.154.
Bambynek, W., Crasemann, B., Fink, R.W., Freund, H.U., Mark, H., Swift, C.D., Price, R.E., and Venugopala, P., Rev. Mod. Phys., 1972, vol. 44, no. 4, p.716.
Finkil'shtein, A.L. and Farkov, P.M., Anal. Kontr., 2002, vol. 6, no. 4.
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Portnoi, A.Y., Pavlinskii, G.V., Dukhanin, A.Y. et al. The Formation of Analytical and Background Signals in Radioisotope X-ray Fluorescence Analysis Using a 241Am Radioactive Source and a Si(Li) Detector. Journal of Analytical Chemistry 59, 1057–1065 (2004). https://doi.org/10.1023/B:JANC.0000047008.57675.5b
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DOI: https://doi.org/10.1023/B:JANC.0000047008.57675.5b