Skip to main content
SpringerLink
Log in

Evaluation of Impurity Concentration in Semiconductors from the Relaxation of Thermally Stimulated Currents

  • Published:
Inorganic Materials Aims and scope

Abstract

The rate equations of thermally stimulated currents due to isothermal detrapping are analyzed. The results demonstrate that, at small trap population, isothermal detrapping follows an exponential law, independent of the trapping rate: fast, slow, or intermediate (the trapping time is comparable to the recombination time). Expressions are derived for determining the density of charged traps in the course of detrapping and assessing the trap density from known trap parameters and thermally stimulated current spectra.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

REFERENCES

  1. Chmyrev, V.I., Skorikov, V.M., Larina, E.V., and Zuev, V.V., Analysis of Differential Equations of Thermally Stimulated Currents in Semiconductors: Arbitrary Heating Profile, Neorg.Mater., 2001, vol. 37, no. 3, pp. 292–297 [Inorg.Mater. (Engl. Transl.), vol. 37, no. 3, pp. 227–232].

    Google Scholar 

  2. Skorikov, V.M., Chmyrev, V.I., Larina, E.V., et al., Thermally Stimulated Currents in Si P,Au: Exponential Heating Profile, Neorg.Mater., 2001, vol. 37, no. 9, pp. 1067–1073 [Inorg.Mater. (Engl. Transl.), vol. 37, no. 9, pp. 904–909].

    Google Scholar 

  3. Skorikov, V.M., Chmyrev, V.I., Zuev, V.V., and Larina, E.V., Thermally Stimulated Currents in Semiconductors: Analysis of Rate Equations for a Single-Level Model and Thermally Stimulated Currents in Si P,Au, Neorg.Mater., 2002, vol. 38, no. 8, pp. 903–936 [Inorg.Mater. (Engl. Transl.), vol. 38, no. 8, pp. 751–780].

    Google Scholar 

  4. Chmyrev, V.I., Dudkina, T.D., Skorikov, V.M., et al., Thermally Stimulated and Photoelectric Effects in Silicon Doped with Gold: I. Analysis of Differential Equations of Thermally Stimulated Current, Neorg.Mater., 1997, vol. 33, no. 9, pp. 1041–1053 [Inorg.Mater. (Engl. Transl.), vol. 33, no. 9, pp. 878–888].

    Google Scholar 

  5. Kiselev, A.I., Krasnov, M.L., and Makarenko, G.I., Sbornik zadach po obyknovennym differentsial'nym uravneniyam (Problems in Ordinary Differential Equations), Moscow: Vysshaya Shkola, 1967, p. 311.

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Kurnakov Institute of General and Inorganic Chemistry, Russian Academy of Sciences, Leninskii pr. 31, Moscow, 119991, Russia

    V. I. Chmyrev & V. M. Skorikov

  2. Moscow Engineering Physics Institute (Technical University), Kashirskoe sh. 31, Moscow, 115409, Russia

    V. V. Zuev

  3. Moscow State University, Moscow, 119899, Russia

    E. V. Larina

Authors
  1. V. I. Chmyrev
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. V. M. Skorikov
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. V. V. Zuev
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. E. V. Larina
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Chmyrev, V.I., Skorikov, V.M., Zuev, V.V. et al. Evaluation of Impurity Concentration in Semiconductors from the Relaxation of Thermally Stimulated Currents. Inorganic Materials 40, 673–679 (2004). https://doi.org/10.1023/B:INMA.0000034764.80484.81

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1023/B:INMA.0000034764.80484.81

Keywords

Search

Navigation