Abstract
It is shown that vanadium layers deposited by magnetron sputtering onto GaAs accelerate surface oxide growth during thermal oxidation. The processes occurring during thermal oxidation on the surface and at the semiconductor–metal interface are interpreted under the assumption that vanadium deposition leads to the formation of an interfacial V x Ga y As z layer, which plays a key role in determining the mechanism of V/GaAs oxidation.
Similar content being viewed by others
REFERENCES
Mittova, I.Ya., Sviridova, V.V., Semenov, V.N., et al., Thermal Oxidation of GaAs in the Presence of Lead Oxide Vapor, Izv. Akad. Nauk SSSR, Neorg. Mater., 1989, vol. 25, no. 6, pp. 908-911.
Mittova, I.Ya., Prokin, A.N., Gavryutin, V.N., et al., High-Temperature Oxidation of Co/InP and Co3O4/InP Structures, Izv. Akad. Nauk, Neorg. Mater., 1976, vol. 12, no. 3, pp. 328-330.
Mittova, I.Ya., Tomina, E.V., Sukhochev, A.S., et al., Solid-State Reactions during Thermal Oxidation of Ni/GaAs Heterostructures, Mikroelektronika, 2002, vol. 31, no. 2, pp. 99-103.
Thin Films: Interdiffusion and Reactions, Poate, J., Tu, K., and Mayer, J., Eds., New York: Wiley, 1978. Translated under the title Tonkie plenki. Vzaimnaya diffuziya i reaktsii, Moscow: Mir, 1982.
Breza, Yu.A., Venger, E.F., Konakova, R.V., et al., Physicochemical Aspects of the Formation of Metal-A3B5 Interfaces and Approaches to Predicting Interfacial Interactions, Poverkhnost, 1998, no. 5, pp. 110-127.
Nakamoto, K., Infrared and Raman Spectra of Inorganic and Coordination Compounds, New York: Wiley, 1986. Translated under the title IK-spektry i spektry KR neorganicheskikh i koordinatsionnykh soedinenii, Moscow: Mir, 1991.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Mittova, I.Y., Tomina, E.V., Lapenko, A.A. et al. Solid-State Reactions during Thermal Oxidation of Vanadium-Modified GaAs Surfaces. Inorganic Materials 40, 441–444 (2004). https://doi.org/10.1023/B:INMA.0000027588.78546.af
Issue Date:
DOI: https://doi.org/10.1023/B:INMA.0000027588.78546.af