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Characterization of the IF Noise of a Submillimeter SIS Receiver

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Abstract

A fitting method is presented here for the accurate characterization of the IF noise contribution of a sub-millimeter SIS receiver. By fitting the mixer's IF output power response and junction's IV curve of an SIS mixer without LO pumping, we can obtain the IF noise contribution, the physical temperature of the isolator connected just behind the SIS mixer, the output mismatching of the mixer, and the total gain of the IF chain. Differing from a conventional method, which only uses the normal-state (linear) branch of the junction's IV curve, the method proposed here also includes the nonlinear portion around the gap voltage. The dynamic resistance in this portion is varied dramatically, providing us a good probe to characterize the output mismatching of the mixer, as well as other parameters.

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Authors and Affiliations

  1. Communications Research Laboratory, 4-2-1, Nukui-kita-machi, Koganei-shi, Tokyo, 184-8795, Japan

    Wenlei Shan, Yoshihisa Irimajiri & Takeshi Manabe

  2. Purple Mountain Observatory, 2 West Beijing Road, Nanjing, 210008, China

    Wenlei Shan & Shengcai Shi

Authors
  1. Wenlei Shan
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  2. Yoshihisa Irimajiri
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  3. Shengcai Shi
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  4. Takeshi Manabe
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Shan, W., Irimajiri, Y., Shi, S. et al. Characterization of the IF Noise of a Submillimeter SIS Receiver. International Journal of Infrared and Millimeter Waves 25, 383–391 (2004). https://doi.org/10.1023/B:IJIM.0000017906.40698.02

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  • DOI: https://doi.org/10.1023/B:IJIM.0000017906.40698.02

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