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A Sensitivity Analysis of Frequency Selective Surfaces at Millimeter Wave Band

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Abstract

This work presents a sensitivity analysis for the resonant frequency and bandwidth of frequency selective surfaces (FSS) as a function of the structural parameters. The frequency selective surface structure considered here is composed by crossed dipole conductive patches deposited on an anisotropic dielectric layer. Firstly, the moment method is used in combination with the immittance technique in the spectral domain to determine the frequency response of the analyzed structure. Secondly, numerical techniques are used to obtain the resonant frequency and bandwidth sensitivities as a function of the considered FSS structural parameters.

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References

  1. A. L. P. S. Campos, A. G. d'Assunção, and L. M. Mendonça, Scattering by FSS on anisotropic substrate for TE and TM excitation, IEEE Transactions on Microwaves Theory and Techniques, Vol. 50, No. 1, (2002), pp. 72-76.

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  2. A. L. P. S. Campos and A. G. d'Assunção, Scattering parameters of FSS on anisotropic layers at millimeter wave frequencies, International Journal of Infrared and Millimeter Waves, Vol. 23, No. 1, (2002), pp. 123-133.

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Authors and Affiliations

  1. Computer Engineering, Potiguar University (UnP), CEP: 59056-000, Natal, RN, Brazil

    Antonio Luiz P.S. Campos

  2. Electrical Engineering Department, Federal University of Rio Grande do Norte (UFRN), C.P. 1655, CEP: 59072-970, Natal, RN, Brazil

    Adaildo Gomes d'Assunção

Authors
  1. Antonio Luiz P.S. Campos
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  2. Adaildo Gomes d'Assunção
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Campos, A.L.P., d'Assunção, A.G. A Sensitivity Analysis of Frequency Selective Surfaces at Millimeter Wave Band. International Journal of Infrared and Millimeter Waves 25, 15–27 (2004). https://doi.org/10.1023/B:IJIM.0000012759.30694.57

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  • DOI: https://doi.org/10.1023/B:IJIM.0000012759.30694.57

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