Abstract
Kinetic measurements were used to assess the effects of N2O, NO, and diethylamine on the chemical vapor deposition of SiO2 films on Si from hexamethyldisiloxane and the effect of diethylamine on the deposition of Al2O3 films on Si, GaAs, and InP from aluminum acetylacetonate. The composition of the films was determined by electron probe x-ray microanalysis and Auger electron spectroscopy. The deposition kinetics and properties of the films are correlated with the nature of the gaseous admixture and process parameters.
Similar content being viewed by others
REFERENCES
Kuiper, A.E.T., Koo, S.W., and Habraken, F.H.P.M., Deposition and Composition of Silicon Oxynitride Films, J. Vac. Sci. Technol., B, 1983, vol. 1, pp. 62–66.
Remerie, J. and Maes, H.E., Physical and Electrical Characterization of LPCVD Oxynitride Layers, Proc. Int. Conf. on Insulating Films on Semiconductors, Amsterdam, 1986, pp. 15–19.
Yorume, Y., Distribution of Nitrogen in Thermally Nitrided SiO2, J. Vac. Sci. Technol., 1983, vol. 1, pp. 67-71.
Menondez, J., Fernandez, M., and Sacedon, J.Z., Thermal Nitridation of Silicon Dioxide Films, J. Vac. Sci. Technol., B, 1988, vol. 6, no. 1, pp. 45–47.
Razuvaev, G.A., Gribov, B.N., Domrachev, G.A., and Salamatin, B.A., Metalloorganicheskie soedineniya v elektronike (Metalorganic Compounds in Electronics), Moscow: Nauka, 1972.
Gribov, B.G., Domrachev, G.A., and Zhuk, B.V., Osazhdenie plenok i pokrytii razlozheniem metalloorganicheskikh soedinenii (Deposition of Films and Coatings from Metalorganic Precursors), Moscow: Nauka, 1981.
Turro, N.J., Molecular Photochemistry, New York: Benjamin, 1965. Translated under the title Molekulyarnaya fotokhimiya, Moscow: Mir, 1967.
Karyakin, Yu.V. and Angelov, I.I., Chistye khimicheskie veshchestva. Rukovodstvo po prigotovleniyu khimicheskikh reaktivov i preparatov v laboratornykh usloviyakh (Pure Chemical Substances: A Guide to the Preparation of Chemical Reagents and Compounds under Laboratory Conditions), Moscow: Khimiya, 1974.
Ugai, Ya.A., Anokhin, V.Z., Mittova, I.Ya., et al., Thermal Oxidation Kinetics of Silicon in the Presence of Antimony and Bismuth Chlorides, Zh. Fiz. Khim., 1981, vol. 55, no. 4, pp. 946–949.
Chu, T.Z., Szedon, J.R., and Zie, C.H., Films of Silicon Nitride-Silicon Dioxide Mixtures, J. Electrochem. Soc., 1968, vol. 115, no. 37, pp. 318–322.
Chistyakov, Yu.D. and Rainova, Yu.P., Fiziko-khimicheskie osnovy tekhnologii mikroelektroniki (Physicochemical Foundations of Microelectronic Technology), Moscow: Metallurgiya, 1979.
Kolobov, N.A. and Samokhvalov, M.M., Diffuziya i okislenie poluprovodnikov (Diffusion and Oxidation of Semiconductors), Moscow: Metallurgiya, 1975.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Mittov, O.N., Ponomareva, N.I., Mittova, I.Y. et al. Deposition of Al2O3 and SiO2 Films via Pyrolysis of Aluminum Acetylacetonate and Hexamethyldisiloxane in the Presence of Nitrogen Compounds. Inorganic Materials 36, 1243–1250 (2000). https://doi.org/10.1023/A:1026685715881
Issue Date:
DOI: https://doi.org/10.1023/A:1026685715881