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An Autonomous Instrument for Measuring Small Electrical Capacitances with a Linear Characteristic

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Measurement Techniques Aims and scope

Abstract

A scheme, the features, the operation and the metrological characteristics of a new simple instrument for measuring small capacitances with a linear measurement characteristic and a sensitivity of 0.01 pF are described.

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REFERENCES

  1. P. Profos (ed.), Measurements in Industry. Methods of Measurement and Apparatus. A Reference Book [in Russian], Metallurgiya, Moscow (1990).

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  2. W. Tittse and K. Shenk, Semiconductor Circuit Technique [Russian translation], Mir, Moscow (1982).

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  3. V. O. Arutyunov, Electrical Measuring Instruments and Measurements [in Russian], GÉI, Moscow, Leningrad (1958).

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Authors
  1. K. K. Kim
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  2. V. Yu. Barbarovich
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  3. V. I. Asmus
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Kim, K.K., Barbarovich, V.Y. & Asmus, V.I. An Autonomous Instrument for Measuring Small Electrical Capacitances with a Linear Characteristic. Measurement Techniques 46, 673–677 (2003). https://doi.org/10.1023/A:1025890918450

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  • DOI: https://doi.org/10.1023/A:1025890918450

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