Abstract
The paper discusses the effects of parasitic quality-factor modulation in a tuned circuit arising on parametric modulation and influencing a capacitance-sensor analyzer. Varicaps may be used for parametric modulation of a semiconductor capacitance in order to improve not only the reliability but also the accuracy of a dielcometric analyzer.
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Podgornyi, Y.V. Improving Dielcometer Reliability. Measurement Techniques 46, 702–709 (2003). https://doi.org/10.1023/A:1025803321175
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DOI: https://doi.org/10.1023/A:1025803321175