Abstract
Three field experiments were carried out with the bean cultivar Carioca Comum to investigate the relationships among visual and virtual severity of angular leaf spot (caused by Phaeoisariopsis griseola), area under visual and virtual disease progress curves (AUDPC), healthy leaf area index on any given day (HLAI), healthy leaf area duration (HAD), healthy leaf area absorption (HAA), effective leaf area duration (ELAD), effective leaf area absorption (ELAA) and yield of Phaseolus vulgaris. To obtain a wide range of disease severities, the plots were sprayed with fungicide at different stages of plant growth (before, during and after flowering). Visual and virtual severity and AUDPC showed no significant correlation with yield. However, HAD, HAA, ELAD and ELAA were significantly correlated with yield. Variables that considered the effective leaf area (ELAD and ELAA) provided similar or better coefficients of determination (R2) than those that considered the remaining green leaf area only (HAD and HAA). Single-point models with HLAI, effective leaf area index (ELAI), intercepted radiation by healthy leaf area (HRI) and intercepted radiation by effective leaf area (EHRI) to estimate yield at various times during the crop season were developed. The slope of the relationship between yield and HLAI, ELAI, HRI and EHRI proved to be stable, regardless of planting date and bean growth stage (from R6 to R8).
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Jesus Junior, W., Vale, F., Coelho, R. et al. Relationships Between Angular Leaf Spot, Healthy Leaf Area, Effective Leaf Area and Yield of Phaseolus vulgaris . European Journal of Plant Pathology 109, 625–632 (2003). https://doi.org/10.1023/A:1024787231063
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DOI: https://doi.org/10.1023/A:1024787231063