Abstract
The aim of this study was to improve the understanding of the deleterious effect of sulfur impurities on the adherence of the thermally-grown oxide on the boundary layer in thermal-barrier-coating systems. In Part I, the sulfur segregation on the free surface of NiAl(001) and at different interfaces between metal and transient alumina scales has been characterized by AES, XPS and LEED. The sulfur diffusion coefficient in the alloy has been determined (D = 0.15 exp(−218,000/RT) cm2/s). It is by three orders of magnitude larger than the nickel and aluminum self-diffusion coefficients. It has also been observed that the sulfur de-segregates upon Al enrichment of the metallic surface. The saturation of the metallic surface with an amorphous alumina layer formed at room temperature blocks the segregation of S. However, in the initial stages of oxidation where the transient θ-alumina grows by cationic transport and inject vacancies at the interface, S segregates at the interface between the alumina thin films and the metallic substrate.
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REFERENCES
L. Rivoaland, V. Maurice, P. Josso, M.P. Bacos, and P. Marcus, Oxid. Met. 60, 159(2003).
J. G. Smeggil, A. W. Funkenbush, and N. S. Bornstein, Met. Trans. A 17, 923(1986).
W. P. Allen, N. S. Bornstein, in Elevated Temperature Coatings: Science and Technology I, N. B. Dahotre, J. M. Hampikian, and J. J. Stiglich, eds. (The Minerals, Metals and Materials Society, 1995) p. 193.
J. L. Smialek, in Microscopy of Oxidation 3, S. B. Newcomb and J. A. Little, eds. (The Institute of Materials, London, 1996) p. 127.
P. Y. Hou, Oxid. Met. 52, 337(1999).
I. G. Wright, B. A. Pint, W. Y. Lee, K. B. Alexander, and K. Prüssner, in High Temperature Surface Engineering (The Institute of Materials, London, 2000), p. 95.
H. J. Grabke, G. Kurbatov, and H. J. Schmutzler, Oxid. Met. 43, 97(1991).
H. J. Schmutzler, H. Viefhaus, and H. J. Grabke, Surf. Int. Analy. 18, 581(1992).
P. Y. Hou. Electrochem. Soc. Proceed. PV98-9 (The Electrochemical Society, Pennington NJ, 1998), p. 198.
H. J. Grabke, Surf. Interf. Analy. 30, 112(2000).
B. A. Pint, Oxid. Met. 45, 1(1996).
H. J. Grabke, M. W. Brumm, and B. Wagemann, in Oxidation of Intermetallics, H. J. Grabke, and M. Schütze, eds. (Wiley, 1997), p. 79.
B. A. Pint, Oxid. Met. 48, 303(1997).
E. P. George, R. L. Kennedy, and D. P. Pope, Phys. Stat. Sol (a) 167, 313(1998).
P. Y. Hou, K. Prüssner, D. H. Fairbrother, J. G. Roberts, and K. B. Alexander, Scripta Met. 40, 241(1998).
A. W. Funkenbush, J. G. Smeggil, and N. S. Borstein, Met. Trans. A 16, 1164(1985).
J. L. Smialek, and R. Browning, Electrochem. Soc. Symp. Proc. on High Temp. Matls. Chem. III, Z. A. Munir and D. Cubicciotti, eds. (1986), p. 259.
D. T. Jayne, and J. L. Smialek, in Microscopy of Oxidation II, S. B. Newcomb and M. J. Bennett, eds. (The Institute of Materials, 1993), p. 183.
K. Prussner, E. Schumann, and M. Rühle, Electrochem. Soc. Proceed. PV96-26 (The Electrochemical Society, Pennington NJ, 1996), p. 344.
J. D. Kiely, T. Yeh, and D. A. Bonnel, Surf. Sci. 393, L126(1997).
P. Y. Hou, K. Prüssner, D. H. Fairbrother, J. G. Roberts, and K. B. Alexander, Scripta Met. 40, 241(1999).
A. Stierle, V. Formoso, F. Comin, and R. Franchy, Surf. Sci. 467, 85(2000).
R. Franchy, Surf. Sci. Reports 38, 195(2000).
N. Frémy, V. Maurice, and P. Marcus, Surf. Interf. Analy. 34, 519(2002).
D. R. Mullins, and S. H. Overbury, Surf. Sci. 199, 141(1988).
R. P. Blum, D. Ahlbehrendt, and H. Niehus, Surf. Sci. 366, 107(1996).
R. P. Blum, and H. Niehus, App. Phys. A 66, S529(1998).
M. P. Seah, and W. A. Dench, Surf. Interf. Analy. 1, 2(1979).
P. Marcus, J. Oudar, and J. Olefjord, Mat. Sci. Eng. 42, 191(1980).
V. Maurice, N. Kitakatsu, M. Siegers, and P. Marcus, Surf. Sci. 373, 307(1997).
P. Wynblatt, and R. C. Ku, Surf. Sci. 65, 511(1977).
M. Foss, et al. Surf. Sci. 296, 283(1993).
J. E. Demuth, D. W. Jepsen, and P. M. Marcus, Phys. Rev. Lett. 31, 540(1973).
S. G. Addepalli, N. P. Magtoto, and J. A. Kelber, Surf. Sci. 458, 123(2000).
J. K. Doychak, J. L. Smialek, and T. E. Mitchell, Metall. Trans. 20A, 499(1989).
P. Gassumann, R. Franchy, and H. Ibach, Surf. Sci. 319, 95(1994).
R. P. Blum, D. Ahlbehrendt, and H. Niehus, Surf. Sci. 396, 176(1998).
D. McLean, Grain Boundaries in Metals, Oxford University Press, London, (1957).
G. F. Hancock, and B. R. McDonnell, Phys. Stat. Sol. (a) 4, 143(1971).
S. Frank, S. V. Divinski, U. Södervall, and C. Herzig, Acta Mat. 49, 1399(2001).
A. Lutze Birk, and H. Jacobi, Scripta Met. 9, 761(1975).
S. J. Wang, and H. J. Grabke, Z. Metallkd 61, 80(1970).
H. Talah, N. Barbouth, and P. Marcus, J. Nucl. Mat. 148, 61(1987).
F. Christien, P. Pouteau, R. Le Gall, G. Saindrenan, and Y. Jaslier, J. Phys. Proceed. 10, 173(1999).
Y. Zhang, F. Zhu, and J. Xiao, Scripta Met. 25, 1617(1991).
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Rivoaland, L., Maurice, V., Josso, P. et al. The Effect of Sulfur Segregation on the Adherence of the Thermally-Grown Oxide on NiAl—I: Sulfur Segregation on the Metallic Surface of NiAl(001) Single-Crystals and at NiAl(001)/Al2O3 Interfaces. Oxidation of Metals 60, 137–157 (2003). https://doi.org/10.1023/A:1024673531473
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DOI: https://doi.org/10.1023/A:1024673531473