Abstract
The chemical composition of cerium-doped silica coatings prepared via sol-gel were studied using X-ray photoelectron spectroscopy (XPS) in conjunction with Ar+-ion sputtering, Rutherford back-scattering spectroscopy (RBS) and photoluminescence (PL) spectroscopy. XPS results showed that cerium was incorporated in the silica network as Ce(III). The absence of PL emissions from Ce(III) was explained by a clustering of the ions producing a quenching of the luminescence. XPS combined with Ar+ and RBS showed that the distribution of Ce is not uniform across the coating, showing a maximum concentration in an inner layer of the coating.
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Cano, E., García, M., Villegas, M. et al. Surface Characterisation of Cerium-Doped Silica Coatings Obtained by Sol-Gel. Journal of Sol-Gel Science and Technology 27, 293–299 (2003). https://doi.org/10.1023/A:1024064818846
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DOI: https://doi.org/10.1023/A:1024064818846