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Determination of interfacial fracture energy of PZT ferroelectric thin films by nano-scratch technique

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Institute of Fundamental Mechanics and Material Engineering, Xiangtan University, Xiangtan, People's Republic of China;

    X. J. Zheng & Y. C. Zhou

  2. Civil Architec0tural Engineering College, Central South University, Changsha, People's Republic of China

    X. J. Zheng

  3. Laboratory of Solid State Microstructures, Nanjing University, Nanjing, People's Republic of China

    J. M. Liu & A. D. Li

Authors
  1. X. J. Zheng
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  2. Y. C. Zhou
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  3. J. M. Liu
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  4. A. D. Li
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Correspondence to Y. C. Zhou.

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Zheng, X.J., Zhou, Y.C., Liu, J.M. et al. Determination of interfacial fracture energy of PZT ferroelectric thin films by nano-scratch technique. Journal of Materials Science Letters 22, 743–745 (2003). https://doi.org/10.1023/A:1023704026723

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  • DOI: https://doi.org/10.1023/A:1023704026723

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