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Origin of the ion migration tendency for several metals in electronics packaging systems

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Journal of Materials Science Letters

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  1. The Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka, 567-0047, Japan

    M. Inoue

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  1. M. Inoue
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Inoue, M. Origin of the ion migration tendency for several metals in electronics packaging systems. Journal of Materials Science Letters 22, 607–609 (2003). https://doi.org/10.1023/A:1023354630638

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  • DOI: https://doi.org/10.1023/A:1023354630638

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