Skip to main content
Log in

MBE growth and structural characterization of ZnS1 − x Se x thin films on ITO/glass substrates

  • Published:
Journal of Materials Science Letters

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

References

  1. I. K. sou, Z. H. Ma and G. K. L. Wong, Appl. Phys. Lett. 75 (1999) 3707.

    Google Scholar 

  2. U. Efron, J. Grinberg, P. O. Braatz, M. J. Little, P. G. Reif and R.N. Schwartz, J. Appl. Phys. 57 (1985) 1356.

    Google Scholar 

  3. G. N. Chaudhari, S. N. Sardesai, S. D. Sathaye and V. J. Rao, J. Mater. Sci. 27 (1992) 4647.

    Google Scholar 

  4. P. Gupta, D. Bhattacharyya, S. Chaudhuri and A. K. Pal, Thin Solid Films, 221 (1992) 154.

    Google Scholar 

  5. Jarkko Ihanus, Mikko Ritala, Markku LeskelÄ, Eero Rauhala, Appl. Surf. Sci. 112 (1997) 154.

    Google Scholar 

  6. J. W. Li, J. D. Chiang, Y. K. Su and M. Yokoyama, J. Cryst. Growth 137 (1994) 421.

    Google Scholar 

  7. S. Armstrong, P. K. Datta and R. W. Miles, Thin Solid Films 403/404 (2002) 126.

    Google Scholar 

  8. Ph. Parent, H. Dexpert, G. Tourillon and J.-M. Grimal, J. Electrochem. Soc. 139 (1992) 276.

    Google Scholar 

  9. B. E. Warren, in “X-ray Diffraction” (Dover, New York, 1990) p. 253.

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to I. K. Sou.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Shen, D., Au, S.Y., Han, G. et al. MBE growth and structural characterization of ZnS1 − x Se x thin films on ITO/glass substrates. Journal of Materials Science Letters 22, 483–487 (2003). https://doi.org/10.1023/A:1022992502295

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1023/A:1022992502295

Keywords

Navigation