Abstract
Expressions for the screening length of an external electrostatic field in a crystalline semiconductor are derived in the Debye–Hückel and Mott–Schottky approximations taking into account electron (hole) hopping via hydrogen-like donors (acceptors). The feasibility of determining the Debye–Hückel screening length from measurements of a quasi-static capacitance with low and high degrees of basic dopant compensation has been demonstrated even in a strong field, that is, in the Mott–Schottky approximation. To measure the capacitance, the electric signal frequency must be much less than the average frequency of electron hopping via donors.
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REFERENCES
B. N. Shvilkin, Usp. Fiz. Nauk, 168, No. 5, 575-576 (1998).
A. A. Vedenov, in: Physics of Solutions [in Russian], Nauka, Moscow (1984), pp. 25-28.
V. N. Ovsyuk, Electronic Processes in Semiconductors with Space-Charge Regions [in Russian], Nauka, Novosibirsk (1984).
T. Sugano, T. Ikoma, and E. Takeisi, in: Introduction to Microelectronics [Russian translation], Mir, Moscow (1988), pp. 109-118.
I. P. Zvyagin, Dokl. Akad. Nauk SSSR, 237, No. 1, 75-78 (1977).
T. E. Kovalevskaya and V. N. Ovsyuk, Fiz. Tekh. Poluprovodn., 30, No. 10, 1739-1744 (1996).
A. S. Vedeneev, A. G. Gaivoronskii, A. G. Zhdan, et al., Pis'ma Zh. Eksp. Teor. Fiz., 57, No. 10, 641-645 (1993).
V. V. Bolotov, G. N. Kamaev, G. N. Feofanov, and V. M. Émeksuzyan, Fiz. Tekh. Poluprovodn., 24, No. 10, 1697-1704 (1990).
V. V. Suprunchik, Zh. Eksp. Teor. Fiz., 110, No. 6 (12), 2127-2134 (1996).
D. G. Esaev and S. P. Sinitsa, Fiz. Tekh. Poluprovodn., 34, No. 10, 1270-1274 (2000).
N. A. Poklonski, A. I. Siaglo, S. A. Vyrko, and V. V. Mitianok, in: Physics, Chemistry and Application of Nanostructures: Review and Short Notes to Nanomeeting-2001, World Scientific, Singapore (2001), pp. 106-109.
N. A. Poklonskii, Izv. Vyssh. Uchebn. Zaved., Fiz., 27, No. 11, 41-43 (1984).
N. A. Poklonski and V. F. Stelmakh, Phys. Status Solidi, B117, No. 1, 93-99 (1983).
N. A. Poklonski, V. F. Stelmakh, V. D. Tkachev, and S. V. Voitikov, Phys. Status Solidi, B88, No. 2, K165-K168 (1978).
N. A. Poklonskii, S. Yu. Lopatin, and A. G. Zabrodskii, Fiz. Tverd. Tela, 42, No. 3, 432-439 (2000).
N. A. Poklonskii and S. Yu. Lopatin, Fiz. Tverd. Tela, 43, No. 12, 2126-2134 (2001).
V. L. Bonch-Bruevich and S. G. Kalashnikov, Physics of Semiconductors [in Russian], Nauka, Moscow (1990).
N. A. Poklonskii, A. I. Syaglo, and G. Biskupski, Fiz. Tekh. Poluprovodn., 33, No. 4, 415-419 (1999).
A. A. Uzakov and A. L. Éfros, Zh. Eksp. Teor. Fiz., 81, No. 5 (11), 1940-1946 (1981).
N. A. Penin, Fiz. Tekh. Poluprovodn., 17, No. 3, 431-436 (1983).
H. Fritzsche and M. Cuevas, in: Proc. Int. Conf. Semicond. Phys., Prague (1961), pp. 222-224.
L. B. Elfimov and P. A. Ivanov, Fiz. Tekh. Poluprovodn., 28, No. 1, 161-167 (1994).
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Poklonskii, N.A., Vyrko, S.A. Screening of an Electric Field and the Quasi-Static Capacitance of an Induced Charge in Semiconductors with Hopping Conductivity. Russian Physics Journal 45, 1001–1007 (2002). https://doi.org/10.1023/A:1022867001332
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DOI: https://doi.org/10.1023/A:1022867001332