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Film-Flow Mechanism of Flaw Development in Penetrant-Dye Tests

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Abstract

A new mechanism of aw development has been discovered and experimentally tested. The mechanism is based on the film ow of the penetrant inside the aw channel.

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REFERENCES

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Authors and Affiliations

  1. Institute of Applied Physics, National Academy of Sciences of Belarus, Minsk, Belarus

    N. P. Migun, P. P. Prokhorenko & S. G. Chizh

Authors
  1. N. P. Migun
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  2. P. P. Prokhorenko
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  3. S. G. Chizh
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Migun, N.P., Prokhorenko, P.P. & Chizh, S.G. Film-Flow Mechanism of Flaw Development in Penetrant-Dye Tests. Russian Journal of Nondestructive Testing 38, 704–708 (2002). https://doi.org/10.1023/A:1022818508002

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  • DOI: https://doi.org/10.1023/A:1022818508002

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