Abstract
Tl2Ba2Ca2Cu3Ox thin films have been fabricated on (001) LaAlO3 and (001) MgO substrates. Films grown on LaAlO3 have Tc=112K and RS(80K, 10GHz)=0.2mΩ, while films on MgO have Tc=117K and Rs(80K, 10GHz)=0.7mΩ. The grain size and alignment of the films has been investigated using X-ray diffraction, Scanning Electron Microscopy and Electron Backscattered Diffraction. We show evidence for a markedly higher in-plane angular spread for films on MgO and believe that for films grown on this substrate the lowest achievable values of Rs are limited by disorder in the in-plane alignment of the TBCCO film caused by the large lattice mismatch between the materials.
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Bramley, A., Wilkinson, A., Jenkins, A. et al. Microstructural Studies of Tl2Ba2Ca2Cu3Ox Thin Films on LaAlO3 and MgO Substrates.. Journal of Superconductivity 11, 71–72 (1998). https://doi.org/10.1023/A:1022685913672
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DOI: https://doi.org/10.1023/A:1022685913672