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Microstructural Studies of Tl2Ba2Ca2Cu3Ox Thin Films on LaAlO3 and MgO Substrates.

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Abstract

Tl2Ba2Ca2Cu3Ox thin films have been fabricated on (001) LaAlO3 and (001) MgO substrates. Films grown on LaAlO3 have Tc=112K and RS(80K, 10GHz)=0.2mΩ, while films on MgO have Tc=117K and Rs(80K, 10GHz)=0.7mΩ. The grain size and alignment of the films has been investigated using X-ray diffraction, Scanning Electron Microscopy and Electron Backscattered Diffraction. We show evidence for a markedly higher in-plane angular spread for films on MgO and believe that for films grown on this substrate the lowest achievable values of Rs are limited by disorder in the in-plane alignment of the TBCCO film caused by the large lattice mismatch between the materials.

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Authors and Affiliations

  1. Department of Materials, University of Oxford, Parks Road, Oxford, 0X1 3PH, UK

    A.P. Bramley, A.J. Wilkinson & C.R.M. Grovenor

  2. Department of Engineering Science, University of Oxford, Parks Road, Oxford, 0X1 3PJ, UK

    A.P Jenkins

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  1. A.P. Bramley
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  2. A.J. Wilkinson
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  3. A.P Jenkins
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  4. C.R.M. Grovenor
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Bramley, A., Wilkinson, A., Jenkins, A. et al. Microstructural Studies of Tl2Ba2Ca2Cu3Ox Thin Films on LaAlO3 and MgO Substrates.. Journal of Superconductivity 11, 71–72 (1998). https://doi.org/10.1023/A:1022685913672

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  • DOI: https://doi.org/10.1023/A:1022685913672

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