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Microstructural Comparison Between Melt Processed, In-situ Processed and Sintered Tl(Bi)-1223/Ag Tapes Using TEM.

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Abstract

We have compared the microstructure of sintered, in-situ and melt processed Tl(Bi)-1223/Ag tapes using TEM. Melt processing of the tapes increases grain connectivity and removes amorphous phases leading to an improvement in the IC/B characteristics of the material. No long range grain alignment, which is the main requirement for improving the properties, was observed in the tapes.

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Authors and Affiliations

  1. Department of Materials, University of Oxford, Parks Road, Oxford, UK

    C.J. Eastell, J.C. Moore, S. Fox, C.R.M. Grovenor & M.J. Goringe

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  1. C.J. Eastell
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  2. J.C. Moore
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  3. S. Fox
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  4. C.R.M. Grovenor
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  5. M.J. Goringe
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Eastell, C., Moore, J., Fox, S. et al. Microstructural Comparison Between Melt Processed, In-situ Processed and Sintered Tl(Bi)-1223/Ag Tapes Using TEM.. Journal of Superconductivity 11, 11–12 (1998). https://doi.org/10.1023/A:1022648905495

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  • DOI: https://doi.org/10.1023/A:1022648905495

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