Skip to main content
Log in

Control Policy for a Manufacturing System with Random Yield and Rework

  • Published:
Journal of Optimization Theory and Applications Aims and scope Submit manuscript

Abstract

We develop a production policy that controls work-in-process (WIP) levels and satisfies demand in a multistage manufacturing system with significant uncertainty in yield, rework, and demand. The problem addressed in this paper is more general than those in the literature in three aspects: (i) multiple products are processed at multiple workstations, and the capacity of each workstation is limited and shared by multiple operations; (ii) the behavior of a production policy is investigated over an infinite-time horizon, and thus the system stability can be evaluated; (iii) the representation of yield and rework uncertainty is generalized. Generalizing both the system structure and the nature of uncertainty requires a new mathematical development in the theory of infinite-horizon stochastic dynamic programming. The theoretical contributions of this paper are the existence proofs of the optimal stationary control for a stochastic dynamic programming problem and the finite covariances of WIP and production levels under the general expression of uncertainty. We develop a simple and explicit sufficient condition that guarantees the existence of both the optimal stationary control and the system stability. We describe how a production policy can be constructed for the manufacturing system based on the propositions derived.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. YANO, C. A., and LEE, H. L., Lot Sizing with Random Yields: A Review, Operations Research, Vol. 43, pp. 311–334, 1995.

    Google Scholar 

  2. KARLIN, S., One Stage Models with Uncertainty, Studies in the Mathematical Theory of Inventory and Production, Edited by K. J. Arrow, S. Karlin, and H. Scarf, Stanford University Press, Stanford, California, 1958.

    Google Scholar 

  3. LEVITAN, R. E., The Optimal Rejection Allowance Problem, Management Science, Vol. 6, pp. 172–186, 1960.

    Google Scholar 

  4. SILVER, E. A., Establishing the Order Quantity When the Amount Received Is Uncertain, INFOR, Vol. 14, pp. 32–39, 1976.

    Google Scholar 

  5. MAZZOLA, J. B., MCCOY, W. F., and WAGNER, H. M., Algorithm and Heuristics for Variable-Yield Lot Sizing, Naval Research Logistics, Vol. 34, pp. 67–86, 1987.

    Google Scholar 

  6. MOINZADEH, K., and LEE, H. L., A Continuous Review Inventory Model with Constant Resupply Time and Defective Items, Naval Research Logistics, Vol. 34, pp. 457–467, 1987.

    Google Scholar 

  7. GERCHAK, Y., VICKSON, R. G., and PARLAR, M., Periodic Review Production Models with Variable Yield and Uncertain Demand, IIE Transactions, Vol. 20, pp. 144–150, 1988.

    Google Scholar 

  8. LEE, H. L., and YANO, C. A., Production Control in Multistage Systems with Variable Yield Losses, Operations Research, Vol. 36, pp. 269–278, 1988.

    Google Scholar 

  9. TANG, C. S., The Impact of Uncertainty on a Production Line, Management Science, Vol. 36, pp. 1518–1531, 1990.

    Google Scholar 

  10. DENARDO, E. V., and TANG, C. S., Linear Control of a Markov Production System, Operations Research, Vol. 40, pp. 259–278, 1992.

    Google Scholar 

  11. AKELLA, R., RAJAGOPALAN, S., and SINGH, M. R., Part Dispatch in Random Yield Multistage Flexible Test Systems for Printed Circuit Boards, Operations Research, Vol. 40, pp. 776–789, 1992.

    Google Scholar 

  12. GRAVES, S. C., Safety Stock in Manufacturing Systems, Journal of Manufacturing and Operations Management, Vol. 1, pp. 67–101, 1988.

    Google Scholar 

  13. GONG, L., and MATSUO, H., Stabilizing Work-in-Process and Smoothing Production in a Production System with Random Yield, IC2 Working Paper, University of Texas at Austin, 1990.

    Google Scholar 

  14. STAPPER, C. H., The Defect-Sensitivity Effect of Memory Chips, IEEE Transactions on Solid State Circuits, Vol. 21, pp. 193–198, 1986.

    Google Scholar 

  15. ALBIN, S. L., and FRIEDMAN, D. J., The Impact of Clustered Defect Distributions in IC Fabrication, Management Science, Vol. 35, pp. 1066–1078, 1989.

    Google Scholar 

  16. JACOBSON, D. H., A General Result in Stochastic Optimal Control of Nonlinear Discrete-Time Systems with Quadratic Performance Criteria, Journal of Mathematical Analysis and Applications, Vol. 47, pp. 153–161, 1974.

    Google Scholar 

  17. BERTSEKAS, D. P., Dynamic Programming and Stochastic Control, Academic Press, San Diego, California, 1976.

    Google Scholar 

  18. KLEINMAN, D. L., Optimal Stationary Control of Linear Systems with Control-Dependent Noise, IEEE Transactions on Automatic Control, Vol. 14, pp. 673–677, 1969.

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

About this article

Cite this article

Gong, L., Matsuo, H. Control Policy for a Manufacturing System with Random Yield and Rework. Journal of Optimization Theory and Applications 95, 149–175 (1997). https://doi.org/10.1023/A:1022639529617

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1023/A:1022639529617

Navigation