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Valence Charge Fluctuations and Tc Retention in Tl1−xPbxSr1+xLa1−xCuO5−y (0.0 ≤ x ≤0.5) System

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Abstract

Structural and x-ray photoelectron spectroscopy (XPS) studies of the Tl1−xPbxSr1+xLa1−xCuO5−y (0.0≤x≤0.5) system have been carried out. The unit cell parameters increase with x. Irrespective of x the Tc is retained in this series and the optimum hole concentration (nh) is maintained for x≤ 0.5. An increase in Tl 4f and O ls binding energy with x suggests a reduction in their oxidation state. Origin of holes is discussed in terms of charge transfer between Tl, Pb and CuO2 layers.

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Authors and Affiliations

  1. Regional Sophisticated Instrumentaion Centre, India

    C. S. Gopinath & S. Subramanian

  2. Materials Science Research Centre, Indian Institute of Technology, Madras, 600 036, India

    M. Rajendran & U. V. Varadaraju

Authors
  1. C. S. Gopinath
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  2. M. Rajendran
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  3. U. V. Varadaraju
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  4. S. Subramanian
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Gopinath, C.S., Rajendran, M., Varadaraju, U.V. et al. Valence Charge Fluctuations and Tc Retention in Tl1−xPbxSr1+xLa1−xCuO5−y (0.0 ≤ x ≤0.5) System. Journal of Superconductivity 11, 139–140 (1998). https://doi.org/10.1023/A:1022639525484

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  • DOI: https://doi.org/10.1023/A:1022639525484

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