Abstract
We report preliminary results of a cyclotron resonance study of surface electrons (SE) on saturated helium films covering a PMMA substrate at T > 1 K. The real and imaginary parts of the dielectric response ∈(k,ω) of the SE are measured at fixed k and ω in B-fields up to 10 T in a 12 GHz cavity. The cyclotron resonance of the SE is determined at different helium film thicknesses d He and at various electron densities. At small d He we find significant anomalies in the cyclotron resonance lineshape and position. As d He increases the lineshape becomes progressively more symmetric and its peak moves towards the cyclotron field value expected for a free electron. To fit these data we have modified the classical Drude expression, introducing two different relaxation times for the low and high B-field regions. The phenomenological formulas fit the data quite well. A systematic theoretical analysis of these results is in progress.
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Mistura, G., Tress, O., Teske, E. et al. Microwave Study of Surface Electrons on Helium Films in a Magnetic Field. Journal of Low Temperature Physics 110, 243–248 (1998). https://doi.org/10.1023/A:1022512128114
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DOI: https://doi.org/10.1023/A:1022512128114