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Millimeter Wave Reflectivity of Conductor-Dielectric Periodic Thin Film

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International Journal of Infrared and Millimeter Waves Aims and scope Submit manuscript

Abstract

Formulations for Conductor-Dielectric Periodic thin film is derived and used to compute millimeter wave reflectivity. The finite conductivity and nonzero thickness of grid, in addition to the influence of substrate can be take into account with invoking no basis functions.

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References

  1. T.L. Dong, “New Approach to Analysing Conductor-Dielectric Periodic Structures,” Electro. Lett., 1987, 23, pp. 1231–1232.

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Authors and Affiliations

  1. Department of Electronics and Information, Huazhong University of Science and Technology, Wuhan, Hubei, 430074, People's Republic of China

    Tian-lin Dong & Wen-jun Li

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  1. Tian-lin Dong
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  2. Wen-jun Li
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Dong, Tl., Li, Wj. Millimeter Wave Reflectivity of Conductor-Dielectric Periodic Thin Film. International Journal of Infrared and Millimeter Waves 20, 1817–1823 (1999). https://doi.org/10.1023/A:1021765732108

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  • DOI: https://doi.org/10.1023/A:1021765732108

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