Abstract
The formation and evolution of the radiation-defect profiles in CdHgTe crystals exposed to high-power ion pulses is examined. A mathematical model for radiation-defect formation allowing for the effects of an inhomogeneous nonstationary temperature field and mechanical quasi-static and dynamic stress fields is discussed. Examples of calculations are given, and the calculated and experimental data are compared.
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Voitsekhovskii, A.V., Kokhanenko, A.P. & Shul'ga, S.A. Calculations of Radiation-Induced Defect Profiles in CdHgTe Crystals Exposed to Ion Pulses. Russian Physics Journal 45, 629–637 (2002). https://doi.org/10.1023/A:1021163722129
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DOI: https://doi.org/10.1023/A:1021163722129