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Study of quasicrystalline thin films based on Al–Pd–Mn and Al–Cu–Fe prepared by PLD

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Czechoslovak Journal of Physics Aims and scope

Abstract

Thin films of Al70Pd20Mn10 Al63Cu25Fe12 Al70Pd20Mn10 and Al63Cu25Fe12 were grown by laser ablation on fused silica at set of deposition temperature −196°C, room temperature 165°C and 350°C. Structure, morphology, resistivity and refractive index of prepared layers were studied.

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Authors
  1. J. Šonský
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  2. M. Jelínek
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  3. L. Jastrabík
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  4. V. Studnička
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  5. D. Chvostová
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  6. Z. Bryknar
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Šonský, J., Jelínek, M., Jastrabík, L. et al. Study of quasicrystalline thin films based on Al–Pd–Mn and Al–Cu–Fe prepared by PLD. Czechoslovak Journal of Physics 47, 1019–1024 (1997). https://doi.org/10.1023/A:1021133222963

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  • DOI: https://doi.org/10.1023/A:1021133222963

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