Abstract
The crystalline phase and composition of sol-gel-derived lead zirconate titanate (PbZr x Ti1 − x O3, PZT) thin films were determined by an X-ray photoelectron spectroscopic (XPS) data processing technique. As a result, it was proved that existence of the surface layer with several tens nm in thickness, of which the crystalline phase and composition were different from those of the inside of the thin films, was found. The newly developed XPS analytical technique is much applicable for the characterization of PZT thin film surface.
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References
K. Suu, A. Osawa, Y. Nishioka, and N. Tani, Jpn. J. Appl. Phys. 36, 5789 (1997).
Y. Fujimori, T. Nakamura, and H. Takasu, Jpn. J. Appl. Phys. 38, 5364 (1999).
H. Fujisawa, M. Yoshida, M. Shimizu, and H. Niu, Jpn. J. Appl. Phys. 37, 5132 (1998).
O. Sugiyama, S. Saito, K. Kato, S. Osumi, and S. Kaneko, J. Ceram. Soc. Jpn. 107, 857 (1999).
O. Sugiyama, S. Saito, K. Kato, S. Osumi, and S. Kaneko, Jpn. J. Appl. Phys. 38, 5461 (1999).
B. Jaffe, W.R. Cook Jr., and H. Jaffe, Piezoelectric Ceramics (Academic Press, New York, 1971), p. 136.
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Sugiyama, O., Kondo, Y., Suzuki, H. et al. XPS Analysis of Lead Zirconate Titanate Thin Films Prepared Via a Sol-Gel Process. Journal of Sol-Gel Science and Technology 26, 749–752 (2003). https://doi.org/10.1023/A:1020758407301
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DOI: https://doi.org/10.1023/A:1020758407301