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Normal and lateral modulation with a scanning force microscope, an analysis: implication in quantitative elastic and friction imaging

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Abstract

Results and an analysis are presented on elastic and friction imaging by indirect force modulation with a scanning force microscope. Two techniques are compared, normal modulation (Z-modulation, perpendicular to the surface of the sample) and lateral modulation of the contact (X-modulation in the plane of the sample, perpendicular to the axis of the cantilever). Theoretical and experimental results show that lateral modulation offers great advantages compared to normal modulation: the images are free of artifacts and can be easily quantified.

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Authors and Affiliations

  1. Laboratoire de Tribologie et Dynamique des Systèmes – UMR CNRS 5513, Ecole Centrale de Lyon, BP 163, 69131, Ecully Cedex, France

    Pierre-Emmanuel Mazeran & Jean-Luc Loubet

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  1. Pierre-Emmanuel Mazeran
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  2. Jean-Luc Loubet
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Mazeran, PE., Loubet, JL. Normal and lateral modulation with a scanning force microscope, an analysis: implication in quantitative elastic and friction imaging. Tribology Letters 7, 199–212 (1999). https://doi.org/10.1023/A:1019142025011

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