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Conduction mechanisms in co-evaporated mixed Mn/Siox thin films

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Abstract

The thermoelectric power and d.c. conductivity of co-evaporated Mn/SiOx films, 100 nm thick, containing 20 to 100 at% Mn have been measured over the temperature ranges 275 to 580 K and 110 and 575 K, respectively. Three conduction regions have been identified: p-type, via non-polaronic holes and small polarons; intrinsic and metallic. The d.c. conductivity arises from a combination of non-activated and activated processes.

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Authors and Affiliations

  1. Department of Physics, Brunel University, Uxbridge, UB8 3PH, UK

    S. Z. A ZAIDI, J BEYNON & C. B STEELE

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  1. S. Z. A ZAIDI
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  2. J BEYNON
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  3. C. B STEELE
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ZAIDI, S.Z.A., BEYNON, J. & STEELE, C.B. Conduction mechanisms in co-evaporated mixed Mn/Siox thin films. Journal of Materials Science 32, 3349–3353 (1997). https://doi.org/10.1023/A:1018600128626

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