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KIM , K.H., CHANG , C.H. & KOO , Y.M. A structural characterization of AlN thin film deposited on a single crystal Al2O3(0 0 0 1) substrate. Journal of Materials Science Letters 16, 1457–1459 (1997). https://doi.org/10.1023/A:1018542217877
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DOI: https://doi.org/10.1023/A:1018542217877