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Physical and electrical characterization of CdS films deposited by vacuum evaporation, solution growth and spray pyrolysis

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Abstract

The physical and electrical characteristics of CdS thin films deposited by vacuum evaporation, solution growth and spray pyrolysis were analysed. The effects of the common grain growth promoter CdCl2 and annealing were investigated. Grain size, bulk composition and surface composition were measured by energy-dispersive X-ray fluorescence, Auger spectroscopy and scanning electron microscopy. Schottky diode analysis was performed to study the electrical characteristics of the films, and energy band gap was measured by spectral transmission.

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Authors and Affiliations

  1. Electrical Engineering Department, Texas, 79968, USA

    H CHAVEZ, J. C McCLURE, G LUSH & V. P SINGH

  2. Metallurgical and Materials Engineering Department, University of Texas, El Paso, Texas, 79968, USA

    M JORDAN

Authors
  1. H CHAVEZ
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  2. M JORDAN
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  3. J. C McCLURE
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  4. G LUSH
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  5. V. P SINGH
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CHAVEZ, H., JORDAN, M., McCLURE, J.C. et al. Physical and electrical characterization of CdS films deposited by vacuum evaporation, solution growth and spray pyrolysis. Journal of Materials Science: Materials in Electronics 8, 151–154 (1997). https://doi.org/10.1023/A:1018537928315

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  • DOI: https://doi.org/10.1023/A:1018537928315

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