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The use of Ols charge referencing for the X-ray photoelectron spectroscopy of Al/Si, AI/Ti and Al/Zr mixed oxides

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Centre for Catalytic Systems and Materials Engineering, Department of Engineering, University of Warwick, Coventry, CV4 7AL, UK

    A. K. Bhattacharya, D. R. Pyke, R. Reynolds, G. S. Walker & C. R. Werrett

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  1. A. K. Bhattacharya
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  2. D. R. Pyke
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  3. R. Reynolds
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  4. G. S. Walker
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  5. C. R. Werrett
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Bhattacharya, A.K., Pyke, D.R., Reynolds, R. et al. The use of Ols charge referencing for the X-ray photoelectron spectroscopy of Al/Si, AI/Ti and Al/Zr mixed oxides. Journal of Materials Science Letters 16, 1–3 (1997). https://doi.org/10.1023/A:1018521126248

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