Abstract
Electrochemical impedance spectroscopy (EIS) and d.c polarization resistance measurements (Rp) were used to study the corrosion resistance of surface layers produced by nitrogen ion implantation into copper substrates. Ion implantation was carried out using a Wickham ion beam generator, applying an acceleration voltage of 100keV, a mean current of 0.40 mA and a nitrogen dosage of 4 × 1017 ions cm−2. Surface analyses were made by Auger electron spectroscopy (AES). Electrochemical measurements (EIS and Rp) performed in a 0.6m sodium chloride solution show nitrogen-implanted specimens have greater a.c. and d.c. apparent polarization resistance than nonimplanted specimens. The results obtained with electrochemical measurements indicate that nitrogen ion implantation in copper forms a protective surface layer which improves the corrosion resistance of the pristine material, a feature of great interest for the design of new contact materials for the electricity and electronic industries.
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References
L. Rehn, S. T. Picraux and H. Wiedersich, in `Surface Alloying by Ion, Electron and Laser beam' (edited by L. Rehn, S. T. Picraux and H. Wiedersich), ASM, Ohio (1987), pp. 1–17.
C. H. Yang, G. Welsch and T. E. Mitchell, J. Mater. Sci. 25 (1990) 1724.
M. Nikolova, K. Takahashi and M. Iwaki, J. Appl. Electrochem. 24 (1994) 52.
R. D. Granata, M. A. De Crosta, J. F. McIntyre and H. Leidheiser, Jr., Ind. Eng. Chem. Res. 26 (1987) 427.
P. Mazzoldi, in `Advanced Techniques for Surface Engineering' (edited by W. Gissler and H. Jehn Kluwer), Academic, Dordrecht (1992), p. 83.
O. Henriksen, E. Johnson, A. Johansen, I. Sarholt-Kristensen and J. Wood, Nucl. Instrum. & Methods Phys. Res. 19/20 (1987) 253.
O. A. Lambri, G. Sanchez, J. Feugeas, and F. Povolo, Surf. Coat. Technol. 70(1-2) (1995) 191.
K. Takahashi, J. Met. Finish. Soc. Jpn 39 (1988) 579.
K. Terashima et al., International Conference on `Surface Modification of Metals by Ion Beams', Kingston, Ontario, 1986, Mater. Sci. Eng. 90 (1987) 229; Surf. Eng. 4 (1988) 90.
E. Leitao, C. Sa, R. A. Silva, M. A. Barbosa and H. Ali, Corros. Sci. 37 (1995) 1861.
P. Aranda, A. Jimenez-Morales, J. C. Galván, B. Casal and E. Ruiz-Hitzky, J. Mater. Chem. 5 (1995) 817; (b) J. C. Galván, P. Aranda, J. M. Amarilla, B. Casal and E. Ruiz-Hitzky, ibid. 3 (1993) 667.
(a) E. Ruiz-Hitzky, P. Aranda, B. Casal and J. C. Galván, Adv. Mater. 7 (1995) 180; (b) E. Ruiz-Hitzky, ibid. 5 (1993) 334.
J. R. Macdonald (ed.), `Impedence Spectroscopy; Emphasizing Solid Materials and Systems', Wiley & Sons, New York (1987).
G. Chiodelli, `Interactive Graphic Programs for F.R.A. Solartron 1255/1260 (V92)', CSTE-CNR / Universita' di Pavia; (b) G. Chiodelli and P. Lupotto, J. Electrochem. Soc. 138 (1991) 2703.
B. A. Boukamp, `Equivalent Circuit' (EQUIVCRT.-PAS), version 4.51. University of Twente, (1989); (b) B. A. Boukamp, Solid State Ionics 20 (1986) 31.
U. Rammelt and G. Reinhard, Electrochim. Acta 35 (1990) 1045.
S. Feliu, J. C. Galván and M. Morcillo, Prog. Organic Coatings 17 (1989) 143.
J. C. Galván, S. Feliu and M. Morcillo, ibid. 17 (1989) 135.
S. Feliu, J. C. Galván and M. Morcillo, Corros. Sci. 30 (1990) 989.
S. T. Zhang, F. P. Kong and R. H. Muller, J. Electrochem. Soc. 141 (1994) 2677.
M. Keddam, X. R. Novoa, L. Soler, C. Andrade and H. Takenouti, Corros. Sci. 36 (1994) 1155.
P. Aranda, J. C. Galván, B. Casal and E. Ruiz-Hitzky, Colloid Polym. Sci. 272 (1994) 712.
R. D. Armstrong, A. K. Covington and G. P. Evans, J.Electroanal. Chem. 159 (1983) 33.
I. Thompson and D. Campbell. Corros. Sci. 37 (1995) 67.
A. Miszczyk and H. Szalinska, Prog.Organic Coatings 25 (1995) 357.
F. Deflorian, L. Fedrizzi and P. L. Bonora, ibid. 23(1-4) (1993) 73.
R. D. Armstrong and D. Wright, Electrochim. Acta 38 (1993) 1799.
R. Oltra and M. Keddam, Corr. Sci. 28 (1988) 1.
D. C. Silverman, Corrosion 46 (1990) 589.
T. Fujihana, N. Matsuzawa, Y. Okabe and M. Iwaki, Proceedings of the 3rd Symposium on `Surface Layer Modifiction by Ion Implantation', Ionics Publishers, Tokio (1987), p. 45.
V. Ashworth, W. A. Grant, R. P. M. Procter and T. C. Wellington, Corros. Sci. 16 (1976) 393.
J. C. Galván, S. Feliu Jr., M. Morcillo, J. M. Bastidas, E. Almeida, J. Simancas and S. Feliu, Electrochim. Acta 37 (1992) 1983.
M. Stern and A. L. Geary, J. Electrochem. Soc. 104 (1957) 56.
L. M. Callow. J. A. Richardson and J. L. Dawson, Bri. Corros. J. 11 (1976) 123.
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JIMENEZ-MORALES , A., GALVAN , J.C., RODRIGUEZ , R. et al. Electrochemical study of the corrosion behaviour of copper surfaces modified by nitrogen ion implantation. Journal of Applied Electrochemistry 27, 550–557 (1997). https://doi.org/10.1023/A:1018446628256
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DOI: https://doi.org/10.1023/A:1018446628256