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Scanning AES and XPS analysis of a thin Au emissivity barrier on Ni alloy

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Abstract

Scanning Auger electron spectroscopy and x-ray photoelectron spectroscopy were used to analyze discolored gold plating on nickel alloys. Gold plated nickel alloy sheets have been used as a thermal shield inside nacelle housings for various jet engines. The thin gold film is applied to serve as a low emissivity coating to reflect thermal radiation. Inconel 625 sheet was gold plated and exposed to 590°C in air for 924 hours to achieve an appropriate service use reference point. The visual appearance of the gold thin-film surface had noticeably dulled after this prolonged exposure. In some cases, several dark spots a few microns in size also appeared on the dulled gold surface. Our hypothesis was that nickel or some alloy constituent had diffused through the gold film and changed the color of the gold surface. X-ray photoelectron spectroscopy and Auger electron spectroscopy were used to differentiate the composition of the gold plated Inconel samples prior to thermal exposure and after the prolonged exposure. Scanning Auger micrographs showed that the composition of the dulled gold surface had changed due to the diffusion of nickel from the substrate alloy through the gold thin film. Nickel was absent at the surface of the unexposed samples while significant nickel concentrations were detected on the discolored gold surface and with the highest nickel levels detected in the dark spots on the gold surfaces. Auger depth profiles made on the exposed gold film verified that a discrete gold layer remained on top of the Inconel with a broad Ni-Cr-Au zone beneath this gold layer.

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References

  1. Liquid Bright Gold, HGL-991BD, Engelhard Corporation, gold thin films produced by Engelhard Corporation, 101WoodAvenue, Iselin, NJ 08830.

  2. T. E. Brady and C. T. Hovland, J.Vac.Sci.Technol. 18(2) 1981.

  3. S. K. Ray and R. K. Lewis, Thin Sold Films 131 (1985) 197.

    Google Scholar 

  4. B. Yan, T. Lin, D. Mao and C. Yang, ibid. 173 (1989) 39.

    Google Scholar 

  5. B. C. Johnson, C. L. Bauer and A. G. Jordan, J.Appl.Phys. 59(4) 1986.

  6. S. P. Pucic, IEEE, Conference Record IMTC' 93, NY, May 1993.

  7. C. M. Wong and P. M. Saelid, Boeing Materials Technology, BMT-SR-1636 (1981).

  8. “Low Emissivity Gold Coating,” Boeing Material Specification 10-82B, The Boeing Company, Seattle, WA 98124 (1992).

  9. NIST Traceable Chemical and Spectrochemical Standards, D-1, Rev. 4/30/97, Analytical Reference Materials International, Inc., Evergreen, CO 80439-2246.

  10. B. D. Ratner and D. G. Castner, “Surface Analysis-The Principle Techniques,” edited by J. C. Vickerman (John Wiley & Sons, Ltd., New York, 1997). p. 43.

    Google Scholar 

  11. R. L. Chaney, Surface and Interface Analysis 10 (1987) 36.

    Google Scholar 

  12. D. Briggs and M. P. Seah, “Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy,” (JohnWiley & Sons, Ltd., New York, 1983).

    Google Scholar 

  13. http://www.rbdenter.com/, 563SW13th Street, Suite 201, Bend, OR 97702.

  14. J. F. Watts, “Handbook of Surface and Interface Analysis,” edited by J. C. Riviere and S. Myhra (Marcel Dekker, Inc., New York, 1998) p. 781.

    Google Scholar 

  15. J. T. Cherian and G. A. Franck, Boeing Materials Technology WR No. 95-00417, unpublished (1995).

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Authors and Affiliations

  1. Northwest Surface Lab;, 4208 South 252nd Place, Kent, WA, 98032

    J. T. Cherian

  2. Department of Materials Science and Engineering, University of Washington, Box 352120, Seattle, WA, 98195, USA

    R. M. Fisher

  3. Department of Chemical Engineering, University of Washington, Box 351750, Seattle, WA, 98195, USA

    D. G. Castner

  4. RBD Enterprises, Inc., 563 SW 13th Street, Suite 201, Bend, OR, 97702, USA

    R. R. Dellwo

Authors
  1. J. T. Cherian
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  2. R. M. Fisher
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  3. D. G. Castner
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  4. R. R. Dellwo
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Cherian, J.T., Fisher, R.M., Castner, D.G. et al. Scanning AES and XPS analysis of a thin Au emissivity barrier on Ni alloy. Journal of Materials Science 36, 4189–4194 (2001). https://doi.org/10.1023/A:1017973006974

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