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Moiré fringes in InSb thin films deposited at 373 K

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Journal of Materials Science Letters

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References

  1. M. ISAI and M. OSHITA, Rev.Sci.Instrum. 61 (1990) 1556.

    Google Scholar 

  2. L. P. CHEN, J. J. LOU, Y. M. PANG and S. J. YANG, Solid State Electron. 35 (1992) 1081.

    Google Scholar 

  3. D. E. HOLUNE and G. S. KAMATH, J.Electron Materials 9 (1980) 95.

    Google Scholar 

  4. P. K. CHIANG and S. M. BEDAIR, Appl.Phys.Lett. 46 (1995) 383.

    Google Scholar 

  5. J. L. DAVIS and P. E. THOMPSON, ibid. 54 (1989) 2235.

    Google Scholar 

  6. T. SINGH and R. K. BEDI, Thin Solid Films 312 (1998) 111.

    Google Scholar 

  7. T. MIYAZAKI, M. KUNUGI, Y. KITAMURE and S. ADACHI, ibid. 287 (1996) 51.

    Google Scholar 

  8. S. SINGH, K. LAL, S. K. SHARMA and Z. H. ZAIDI, ibid. (communicated).

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Sharma, S.K., Tomokiyo, Y., Singh, S. et al. Moiré fringes in InSb thin films deposited at 373 K. Journal of Materials Science Letters 20, 2193–2196 (2001). https://doi.org/10.1023/A:1017972615960

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