Abstract
A TEM investigation of MOVPE grown Zn3As2 revealed the presence of a thin epitaxial Zn3P2 intermediate layer between the InP substrate and the Zn3As2 overgrowth. A model of the orientation relationships between Zn3As2, Zn3P2 and InP is presented. The origin of the Zn3P2 layer was ascribed to the diffusion of Zn atoms into the InP substrate, aided simultaneously by P diffusion from the substrate. A simulation of the Zn3As2 lattice image is presented for the first time, together with a high resolution transmission electron microscopy (HRTEM) image of the Zn3As2/Zn3P2 interface.
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B. Chelluri, T. Y. Chang, A. Ourmazd, A. H. Dayem, J. L. Zyskind and A. Srivastava, J.Cryst. Growth 81 (1987) 530.
W. J. Turner, A. S. Fischler and W. E. Reese, Physical Review 121 (1961) 759.
G. J. Scriven and A. W. R. Leitch, Thin Solid Films, 2001, submitted.
B. Sujak-Cyrul, B. Kolodka and J. Misiewicz, J.Phys.Chem.Solids 43 (1982) 1045.
A. Hupfer, D. Hirsch and S. Schulze, Phys.Stat.Sol. (b) 152 (1989) 505.
K. SieraÑski and J. Szatkowski, ibid. 173 (1992) K25.
B. Chelluri, T. Y. Chang, A. Ourmazd, A. H. Dayem, J. L. Zyskind and A. Srivastava, Appl.Phys. Lett. 49 (1986) 1665.
A. Pietraszko and K. Lukaszewicz, Phys.Stat.Sol.(a) 18 (1973) 723.
G. J. Scriven, A. W. R. Leitch, J. H. Neethling, V. V. Kozyrkov and V. J. Watters, J.Cryst.Growth 170 (1997) 813.
P. Stadelman, EMS 3.3., Ultramicroscopy 21 (1987) 131.
K. SieraÑski, J. Szatkowski and J. Misiewicz, Physical Review B 50 (1994) 7331.
R. W. G. Wyckoff, “Crystal Structures: Volume 2, Inorganic Compounds RXn, RnMX2, RnMX3” (Interscience Publishers, New York, 1964) p. 32.
D. M. Hwang, S. A. Schwarz, P. Mei, R. Bhat, T. Venkatesan, L. Nazar and C. L. Schwarz, Appl. Phys.Lett. 54 (1989) 1160.
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Neethling, J.H., Scriven, G.J. & Krekels, T. A TEM investigation of Zn3As2 grown on (001) and (111) InP by MOVPE. Journal of Materials Science 36, 3997–4002 (2001). https://doi.org/10.1023/A:1017934624840
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DOI: https://doi.org/10.1023/A:1017934624840