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Growth and properties of Sr1−xBaxBi2TaNbO9 materials and thin films

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Abstract

Sr1−x Ba x Bi2TaNbO9 materials have been synthesized using a chemical solution route. Detailed x-ray diffraction and Raman spectroscopic studies indicates the formation of complete solid solutions for all compositions (x = 0.0 to 1.00) in Sr1−x Ba x Bi2TaNbO9. Thin films were deposited by spin coating. Optical transmission of the film deposited on quartz disk showed the typical interference effect of optical thin films. Ferroelectric polarization on Sr0.5Ba05Bi2TaNbO9 film deposited on Pt substrate and annealed at 700 °C, was measured to be 13.5 μC/cm2.

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Authors and Affiliations

  1. Physics Department, University of Puerto Rico, Mayaguez, PR, 00681-9016

    M. S. Tomar & R. E. Melgarejo

  2. Physics Department, University of Puerto Rico, San Juan, PR, 00931-3343

    P. S. Dobal, M. Jain & R. S. Katiyar

Authors
  1. M. S. Tomar
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  2. R. E. Melgarejo
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  3. P. S. Dobal
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  4. M. Jain
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  5. R. S. Katiyar
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Correspondence to M. S. Tomar.

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Tomar, M.S., Melgarejo, R.E., Dobal, P.S. et al. Growth and properties of Sr1−xBaxBi2TaNbO9 materials and thin films. Journal of Materials Science 36, 3919–3923 (2001). https://doi.org/10.1023/A:1017914020297

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