Abstract
Methods of determining point estimates of the residual life of test techniques and radioelectronic components are analyzed. Problems of constructing calculable group and individual models of typical components in order to predict their residual life are considered.
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REFERENCES
G. S. Sadykhov and A. V. Blinov, Metrolog., No. 12, 31 (2001).
G. S. Sadykhov and V. P. Savchenko, Dokl. Akad. Nauk, 361, No. 2, 189 (1998).
G. S. Sadykhov, The Residual Life of Technical Apparatus and Methods of Estimating it [in Russian], Znanie, Moscow (1986), p. 51.
M. D. Kendall and A. Stuart, Statistical Results and Relations [Russian translation], Nauka, Moscow (1973).
R. S. Sudakov (ed.), Statistical Problems of System Exhaustion and Tables for Numerial Calculations of Reliability [in Russian], Vysshaya Shkola, Moscow (1975).
G. S. Sadykhov and V. P. Savchenko, Dokl. Akad. Nauk, 343, No. 4, 469 (1995).
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Sadykhov, G.S., Blinov, A.V. Modeling of Estimates of the Residual Life of Test Instruments and Radioelectronic Apparatus. Measurement Techniques 45, 195–200 (2002). https://doi.org/10.1023/A:1015504108439
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DOI: https://doi.org/10.1023/A:1015504108439