Abstract
The magnetic susceptibility of thin films and microstructures consisting of a Pd1−xMnx alloy have been measured as a function of temperature and magnetic field. Sputtering from a 0.68% manganese target produced films with a concentration of approximately 0.90%, as judged by comparison with results from bulk PdMn sensitivity measurements. The thinnest films (thickness ≤1.0μm) show significant domain scale noise below the Curie Temperature, T c , while thicker films (thickness ≥10μm) show reliable non-hysteretic behavior throughout the temperature range of interest. The thin films show the effects of demagnetization with the field perpendicular to the surface, but a fine screen in this orientation shows no evidence of saturation and a predictable decrease in sensitivity due to demagnetization. These films will serve as the thermometric element in a new class of bolometers and thermometers for fundamental physics applications.
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Nelson, R.C., Sergatskov, D.A. & Duncan, R.V. The Magnetic Properties of Sputtered Pd1−xMnx Films for Thermometry and Bolometry. Journal of Low Temperature Physics 127, 173–188 (2002). https://doi.org/10.1023/A:1014808313480
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DOI: https://doi.org/10.1023/A:1014808313480