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Estimate of the Accuracy of Multiparameter Monitoring Taking Its Depth into Account

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Abstract

Expressions are obtained for the accuracy characteristics of multiparameter monitoring, the risks to the supplier and customer which take into account the depth of the monitoring, the metrological characteristics of its hardware, and the delivery and production norms.

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References

  1. GOST 23564-79 “Diagnostics Indicators” [in Russian].

  2. W. D. Moon, Electrotechnology, 73, No. 1, 46 (1964).

    Google Scholar 

  3. A. S. Bondarevskii and V. N. Tkacheva, Nadezh. Kontr. Kachest., No. 12, 44 (1983).

    Google Scholar 

  4. B. B. Dunaev and V. G. Kendel', Determination of Instrumental Monitoring Reliability in the series: Theory of Accuracy and Reliability of Cybernetic Systems [in Russian], Academy of Sciences of the Ukrainian SSR, Kiev (1969), No. 1, p. 49.

    Google Scholar 

  5. M. I. Kochenov, Questions of Accuracy and Reliability in Mechanical Engineering [in Russian], Academy of Sciences of the USSR, Moscow (1962), p. 46.

    Google Scholar 

  6. B. B. Dunaev, Accuracy of Measurements when Monitoring Quality [in Russian], Tekhnika, Kiev (1981).

    Google Scholar 

  7. E. I. Sychev, Izmerit. Tekh., No. 7, 12 (1982).

    Google Scholar 

  8. N. I. Lesin, Nadezh. Kontr. Kachest., No. 8, 44 (1982).

    Google Scholar 

  9. A. S. Bondarevskii, Mikroélectron., 13, No. 6, 505 (1984).

    Google Scholar 

  10. M. Zamanskii, Introduction to Modern Algebra and Analysis [in Russian], Nauka, Moscow (1974).

    Google Scholar 

  11. R. N. Belokon', V. G. Kendel', and V. K. Poltoratskaya, Applied Mathematics: Proceedings of the Seminar on Applied Mathematics in Irkutsk Town [in Russian], State University, Irkutsk (1971), p. 95.

    Google Scholar 

  12. A. A. Nikitin and S. K. Savin, Nadezh. Kontr. Kachest., No. 10, 39 (1976).

    Google Scholar 

  13. A. S. Bondarevskii, Izmerit. Tekh., No. 2, 14 (1983).

    Google Scholar 

  14. A. S. Bondarevskii, Izmerit. Tekh., No. 4, 18 (1980).

    Google Scholar 

  15. N. D. Dubovoi et al., “Measurements and monitoring in microelectronics,” in: Textbook for Higher Educational Institutes for Electronic Engineering Specialties (ed. A. A. Sazonov) [in Russian], Vysshaya Shkola, Moscow (1984).

    Google Scholar 

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Bondarevskii, A.S. Estimate of the Accuracy of Multiparameter Monitoring Taking Its Depth into Account. Measurement Techniques 44, 802–808 (2001). https://doi.org/10.1023/A:1012940216590

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  • DOI: https://doi.org/10.1023/A:1012940216590

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