Skip to main content
SpringerLink
Log in

Computer Modeling of the Metrological Characteristics of Standard Measuring Instruments

  • Published:
Measurement Techniques Aims and scope

Abstract

The possibilities are considered of the computer modeling of the metrological characteristics of a standard instrument for measuring spectral noise power density utilizing low-temperature waveguide noise generators operating in the millimeter wavelength range.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. O. G. Petrosyan, Izmerit. Tekh., No. 3, 40 (1991).

    Google Scholar 

  2. V. A. Gol'ba, O. G. Petrosyan, and S. P. Bykov, Izmerit. Tekh., No. 2, 48 (1986).

    Google Scholar 

  3. Yu. V. Kistovich and O. G. Petrosyan, Izmerit. Tekh., No. 7, 54 (1996).

    Google Scholar 

  4. Yu. V. Kistovich and O. G. Petrosyan, Izmerit. Tekh., No. 5, 46 (1998).

    Google Scholar 

  5. Yu. V. Kistovich, A. V. Kistovich, O. G. Petrosyan, and M. V. Sargsyan, Izmerit. Tekh., No. 2, 35

Download references

Authors
  1. O. G. Petrosyan
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. M. V. Sargsyan
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Petrosyan, O.G., Sargsyan, M.V. Computer Modeling of the Metrological Characteristics of Standard Measuring Instruments. Measurement Techniques 44, 779–784 (2001). https://doi.org/10.1023/A:1012939031611

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1023/A:1012939031611

Keywords

Search

Navigation