Abstract
Total electron emission from metals due to the impact of multiply charged ions, γ, may significantly influence quantitative measurements of ion current in corpuscular diagnostics. The value of γ (γ/q) was determined for Xe ions impacting clean polycrystalline copper as a function of ion charge state \(\left( {q = 6 - 28} \right)\) and of ion kinetic energy, \(E_i /q = \left( {5 - 150} \right)\) keV/q, i.e. in the energy region up to \(E_i /A \approx 30\) keV/amu, where there is a lack of such data. For highly charged projectile ions, \({\gamma}\) was found to have a clear minimum as a function of E i. With decreasing charge state of the projectile ion this minimum shifts to a lower energy and becomes shallower. This observation is in agreement with compiled results of other authors. Limits for values of \({\gamma /}q\) are estimated and discussed.
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Láska, L., Krása, J., Stöckli, M. et al. Total Electron Emission from Metals Due to the Impact of Highly-Charged Xe Ions with Energies Up to MeV. Czechoslovak Journal of Physics 51, 791–798 (2001). https://doi.org/10.1023/A:1011670332292
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DOI: https://doi.org/10.1023/A:1011670332292