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Dispersion Analysis of Birefringent Dielectric Grating Structure for Application in Pressure and Temperature Measurements

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Abstract

In this paper, the dispersion characteristics of a birefringence dielectric planar grating structure for application in pressure and temperature measurements are analyzed by a method, which combines the edge element method with rigorous mode matching approach. Analysis results show that this new anisotropic grating structure offers very high sensitivity for pressure and temperature measurements. Also it is justified that the present method has the advantages of simplicity, accuracy and suitability.

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Authors and Affiliations

  1. Department of Electronic Engineering and Information Science, University of Science and Technology of China, Hefei, 230027, People's Republic of China

    Shanjia Xu & Jian Liu

  2. Research Institute of Electrical Communication, Tohoku University, Sendai, 980-8577, Japan

    Koji Mizuno

Authors
  1. Shanjia Xu
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  2. Jian Liu
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  3. Koji Mizuno
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Xu, S., Liu, J. & Mizuno, K. Dispersion Analysis of Birefringent Dielectric Grating Structure for Application in Pressure and Temperature Measurements. International Journal of Infrared and Millimeter Waves 22, 407–420 (2001). https://doi.org/10.1023/A:1010741722091

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  • DOI: https://doi.org/10.1023/A:1010741722091

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