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Self-Dual Self-Testing Multicycle Circuits: Their Properties

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Abstract

Functional testing of memory circuits based on the properties of self-dual functions and a procedure for transforming the initial circuit into a self-dual circuit are described. Experimental results for MCNC benchmark circuits are given.

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Authors and Affiliations

  1. University of Potsdam, Potsdam, Germany

    M. Gessel'

  2. St. Petersburg State Transport University, St. Petersburg, Russia

    A. V. Dmitriev, V. V. Sapozhnikov & Vl. V. Sapozhnikov

Authors
  1. M. Gessel'
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  2. A. V. Dmitriev
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  3. V. V. Sapozhnikov
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  4. Vl. V. Sapozhnikov
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Gessel', M., Dmitriev, A.V., Sapozhnikov, V.V. et al. Self-Dual Self-Testing Multicycle Circuits: Their Properties. Automation and Remote Control 62, 642–652 (2001). https://doi.org/10.1023/A:1010245914985

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  • DOI: https://doi.org/10.1023/A:1010245914985

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