Abstract
The surface morphology of (0 0 1) Bi4Ti3O12 grown on (0 0 1) SrTiO3 by reactive molecular beam epitaxy (MBE) has been examined using atomic force microscopy (AFM). Initial nucleation of a 1/4 unit cell thick layer is followed by growth of 1/2 unit cell thick layers. Between 9 and 16 layers, a transition to 3-dimensional growth occurs, leading to well-defined mounds. This implies a Stranski-Krastonov growth mode. During growth, the morphology follows a behavior consistent with the dynamic scaling hypothesis and we extract values for the scaling exponents α and β from the AFM data. A thickness variation in α is observed and reflects the strain relief associated with the Stranski-Krastonov growth.
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Brown, G., Hawley, M., Theis, C. et al. Atomic Force Microscopy Examination of the Evolution of the Surface Morphology of Bi4Ti3O12 grown by Molecular Beam Epitaxy. Journal of Electroceramics 4, 351–356 (2000). https://doi.org/10.1023/A:1009918711349
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DOI: https://doi.org/10.1023/A:1009918711349