Abstract
We demonstrate a method for successfully controlling carbon incorporation in AlAs layers grown by atomic layer epitaxy (ALE) using various GaAs substrates with different orientations. The number of alkyl radicals attached to an Al atom at the surface, which is a main factor in carbon incorporation, can be intentionally controlled by changing substrate orientation. We found that the carbon incorporation in ALE-AlAs using the (3 1 1)B surface is 2 x 1017,cm-3, which is the lowest value ever reported for ALE-AlAs that satisfies one-monolayer self-limiting growth conditions.
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Hirose, S., Yoshida, A., Yamaura, M. et al. Control of carbon incorporation in AlAs grown by atomic layer epitaxy using variously orientated substrates. Journal of Materials Science: Materials in Electronics 11, 7–10 (2000). https://doi.org/10.1023/A:1008991717393
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DOI: https://doi.org/10.1023/A:1008991717393