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Measurement and characterization of the frequency noise of a laser-diode-pumped single-frequency Tm-Ho:YAG laser

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Abstract

The frequency noise characteristics of a single-frequency 2.1-μm Tm-Ho:YAG laser have been thoroughly investigated. From the measurement of the frequency noise spectral density, performed by means of an interferometric technique, a short-term laser linewidth of 550 kHz over 1-ms time interval has been obtained. The frequency stability, defined as the two sample standard deviation of the frequency fluctuations with dead time T, has been also evaluated, obtaining values ranging from ∼250 kHz to ∼2.5 MHz for T values between 1 and 100 ms over an observation time of 100 ns. It has been shown through a numerical analysis that a significant improvement is achievable, attaining a frequency stability of ∼25 kHz for T up to 100 ms, by using the Pound–Drever locking technique in connection with a roto-vibrational line of the HBr molecule.

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Laporta, P., Bava, E., Svelto, C. et al. Measurement and characterization of the frequency noise of a laser-diode-pumped single-frequency Tm-Ho:YAG laser. Optical and Quantum Electronics 32, 1081–1095 (2000). https://doi.org/10.1023/A:1007051405768

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  • DOI: https://doi.org/10.1023/A:1007051405768

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