References
A. NAKAMICHI, A. KISHIMOTO and Y. NAKAMURA, J. Mater. Sci. Lett. 14 (1998) 249.
R. F. COOK and G. M. PHARR, J. Amer. Ceram. Soc. 73 (1990) 787.
D. B. MARSHALL and B. R. LAWN, J. Mater. Sci. 14 (1979) 2001.
K. SUGAI, A. KISHIMOTO, Y. NAKAMURA, N. MOTOHIRA and H. YANAGIDA, J. Ceram. Soc. Jpn. 103(7) (1995) 732.
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Sadotani, N., Hirano, S. & Kishimoto, A. In-situ monitoring of indentation fracture in semiconductive titania ceramics utilizing electric conduction. Journal of Materials Science Letters 19, 221–223 (2000). https://doi.org/10.1023/A:1006758624648
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DOI: https://doi.org/10.1023/A:1006758624648