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Use of focused ion beam (FIB) techniques for production of diamond probe for nanotechnology-based single filament push-out tests

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Advanced Concrete and Masonry Centre, University of Paisley, High St, PA1 2LH, Scotland, UK

    P. Trtik & P. J. M. Bartos

  2. Microelectronics Imaging and Analysis Centre, Department of Electronics and Electrical Engineering, University of Edinburgh, EH9 3JH, Scotland, UK

    C. M. Reeves

Authors
  1. P. Trtik
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  2. C. M. Reeves
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  3. P. J. M. Bartos
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Trtik, P., Reeves, C.M. & Bartos, P.J.M. Use of focused ion beam (FIB) techniques for production of diamond probe for nanotechnology-based single filament push-out tests. Journal of Materials Science Letters 19, 903–905 (2000). https://doi.org/10.1023/A:1006758119723

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  • DOI: https://doi.org/10.1023/A:1006758119723

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